A Highly Stable Organic–Inorganic Hybrid Electron Transport Layer for Ultraflexible Organic Photodiodes
Abstract
Abstract Flexible organic photodiodes (OPDs) are used to detect light in system‐scale demonstrations of skin‐conformable devices. However, the detectivity of OPDs deteriorates under various environmental conditions, such as light irradiation, air exposure, and heating. This decrease in detectivity is observed in OPDs with a widely used sol–gel ZnO (ZnO SG) electron transport layer (ETL), where the dark current at the reverse bias increased by several orders of magnitude. In this study, a low dark current and stable detectivity with respect to the aforementioned external changes are achieved. The enhanced stability stems from the suppression of the increase in dark current realized by using a mixture of an organic polymer, polyethyleneimine (PEIE), and inorganic crystals (ZnO nanoparticles) to create a nanoparticle‐based, Zn‐chelated PEIE (PEI‐Zn NP) as the ETL of the OPDs. The detectivities of OPDs with PEI‐Zn NP are 89%, 84%, and 93% of their original values after light irradiation, air storage, and thermal heating, respectively. In contrast, their ZnO SG counterparts exhibited stabilities of only 9.9%, 55%, and 2.6%, respectively, in the same tests. Furthermore, the use of PEI‐Zn NP ETL in ultraflexible OPDs is demonstrated by the maintained detectivity after 5000 cycles of device bending.
Article Details
Authors (12)
Theodorus Jonathan Wijaya
Sixing Xiong
RIKEN Center for Emergent Matter Science (CEMS) Wako Saitama Japan
Kosei Sasaki
Yutaro Kato
Department of Electrical Engineering and Information Systems Graduate School of Engineering The University of Tokyo 7‐3‐1 Hongo Bunkyo‐ku Tokyo 113‐8656 Japan
Kazuma Mori
Mari Koizumi
Department of Electrical Engineering and Information Systems Graduate School of Engineering The University of Tokyo 7‐3‐1 Hongo Bunkyo‐ku Tokyo 113‐8656 Japan
Sunghoon Lee
Thin-Film Device Laboratory, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
Masaki Kobayashi
Yinhua Zhou
Kenjiro Fukuda
Thin-Film Device Laboratory, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
Tomoyuki Yokota
Takao Someya
Thin-Film Device Laboratory, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan