Crosstalk‐Enabled High In‐Plane Anisotropy of Monolayer MoS <sub>2</sub> Nanoribbons

Q Qingqing Luo Y Yufeng Huang Y Yuhang Wang (State Key Laboratory of Bioinspired Interfacial Materials Science, Institute of Functional Nano & Soft Materials (FUNSOM), Soochow University, 199 Ren’ai Road, Suzhou, Jiangsu 215123, P. R. China) Y Yimeng Shi (State Key Laboratory of Integrated Optoelectronics Key Laboratory of UV‐Emitting Materials and Technology of Ministry of Education Northeast Normal University Changchun 130024 China) J Jiawei Jing G Guoshuai Fan (State Key Laboratory of Precision Measuring Technology and Instruments School of Precision Instrument and Optoelectronics Engineering Tianjin University Weijin Road No.92 Nankai District Tianjin 300072 China) Y Yu Yu Y Yanning Li L Lidong Sun E Enxiu Wu Y Yelong Zheng (State Key Laboratory of Precision Measuring Technology and Instruments School of Precision Instrument and Optoelectronics Engineering Tianjin University Weijin Road No.92 Nankai District Tianjin 300072 China) M Meirong Zhao (State Key Laboratory of Precision Measuring Technology and Instruments School of Precision Instrument and Optoelectronics Engineering Tianjin University Weijin Road No.92 Nankai District Tianjin 300072 China) C Chunguang Hu W Wei Xin W Wanfu Shen

Abstract

Abstract Researchers now successfully fabricate well‐aligned transition metal dichalcogenide (TMD) nanowires and nanobelts. However, achieving efficient carrier transport perpendicular to the nanowire direction remains a significant challenge, which continues to limit their application in integrated polarization‐sensitive devices. Based on the synergistic mechanism of precursor anisotropic diffusion and step‐edge‐guided growth, an effective chemical vapor deposition (CVD) approach enabled by in situ coverage monitoring is developed to overcome existing limitations. By precisely terminating the growth process at its optimal stage, highly aligned and crosstalked monolayer MoS 2 nanoribbons (NRs) are obtained. Crucially, these NRs demonstrate efficient current conduction along both the parallel and perpendicular directions, enabled by the inter‐ribbon crosstalk structures. Reflection difference spectroscopy (RDS) and polarized Raman characterization confirm strong in‐plane optical anisotropy within the arrays. Electrical measurements reveal a remarkably high parallel‐to‐perpendicular current ratio of up to 63.2 at 30 V bias, enabling a distinct polarized light response. Furthermore, transient absorption (TA) spectroscopy uncovers anisotropic carrier dynamics in the NR arrays. This work represents the first demonstration of mimicking the differential electrical transport behavior characteristic of intrinsically anisotropic materials using an otherwise isotropic TMD material system, opening new possibilities for anisotropic optoelectronics.

Article Details

Volume / Issue Vol. 38, Issue 6
Published January 01, 2026
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (15)

Q

Qingqing Luo

Y

Yufeng Huang

Y

Yuhang Wang

State Key Laboratory of Bioinspired Interfacial Materials Science, Institute of Functional Nano & Soft Materials (FUNSOM), Soochow University, 199 Ren’ai Road, Suzhou, Jiangsu 215123, P. R. China

Y

Yimeng Shi

State Key Laboratory of Integrated Optoelectronics Key Laboratory of UV‐Emitting Materials and Technology of Ministry of Education Northeast Normal University Changchun 130024 China

J

Jiawei Jing

G

Guoshuai Fan

State Key Laboratory of Precision Measuring Technology and Instruments School of Precision Instrument and Optoelectronics Engineering Tianjin University Weijin Road No.92 Nankai District Tianjin 300072 China

Y

Yu Yu

Y

Yanning Li

L

Lidong Sun

E

Enxiu Wu

Y

Yelong Zheng

State Key Laboratory of Precision Measuring Technology and Instruments School of Precision Instrument and Optoelectronics Engineering Tianjin University Weijin Road No.92 Nankai District Tianjin 300072 China

M

Meirong Zhao

State Key Laboratory of Precision Measuring Technology and Instruments School of Precision Instrument and Optoelectronics Engineering Tianjin University Weijin Road No.92 Nankai District Tianjin 300072 China

C

Chunguang Hu

W

Wei Xin

W

Wanfu Shen