Electrostatic Gaussian Transistor for Real‐Time Probabilistic Inference
Abstract
ABSTRACT Gaussian distribution functions underpin a wide range of probabilistic computing models, yet their faithful and tunable implementation at the hardware level remains a fundamental challenge. Conventional approaches based on anti‐ambipolar transistors rely on heterojunctions formed from dissimilar semiconducting materials, introducing intrinsic asymmetries in carrier mobility, interface quality, and band alignment that prevent accurate mirroring of symmetric Gaussian curves. Here we report a single‐material, single‐channel split‐gate Gaussian‐mirroring transistor (SC‐GMT) that generates symmetric, Gaussian‐shaped transfer curves through reversal voltage biasing. By independently modulating carrier concentrations via split‐gate control, the device achieves tunable amplitude, mean, and standard deviation with >99.99% coefficient of determination to ideal Gaussian distributions. To demonstrate practical utility, we integrate the SC‐GMT into a custom‐built printed circuit board with digital‐to‐analog control and real‐time current sensing. Using this platform, we implement a hardware Gaussian Naive Bayes (GNB) classifier capable of distinguishing deepfake and authentic voices with 82% accuracy. Moreover, the transistor's drain current scales with the product of two gate voltages, enabling quadratic‐order analog multiplication critical for probabilistic models and attention‐based architectures.
Article Details
Authors (11)
Youngmin Han
Youngwoo Yoo
Minseo Kim
Department of Semiconductor Engineering Gachon University Seongnam Republic of Korea
Dinithi Jayasuriya
Department of Electrical and Computer Engineering University of Illinois Chicago Illinois USA
Nethmi Jayasinghe
Akshay Subramanian
Stevenson High School Lincolnshire Illinois USA
Deep Jariwala
Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Chang‐Hyun Kim
School of Electrical Engineering and Computer Science University of Ottawa Ottawa ON Canada
Amit Ranjan Trivedi
Department of Electrical and Computer Engineering University of Illinois Chicago Illinois USA
Young‐Joon Kim
Department of Semiconductor Engineering Gachon University Seongnam Republic of Korea
Hocheon Yoo