In‐device Battery Failure Analysis

G Guannan Qian (Walker Department of Mechanical Engineering) G Guibin Zan (Stanford Synchrotron Radiation Lightsource SLAC National Accelerator Laboratory Menlo Park CA 94025 USA) J Jizhou Li D Dechao Meng T Tianxiao Sun (Walker Department of Mechanical Engineering) V Vivek Thampy A Ayrton M. Yanyachi (Walker Department of Mechanical Engineering The University of Texas at Austin Austin TX 78712 USA) X Xiaojing Huang H Hanfei Yan (National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, United States) Y Yong S. Chu S Sheraz Gul (Sigray Inc. Concord CA 94250 USA) J Juanjuan Huang S Shelly D. Kelly (Advanced Photon Source Argonne National Laboratory Lemont IL 60439 USA) S Sang‐Jun Lee (Stanford Synchrotron Radiation Lightsource SLAC National Accelerator Laboratory Menlo Park CA 94025 USA) J Jun‐Sik Lee (Stanford Synchrotron Radiation Lightsource SLAC National Accelerator Laboratory Menlo Park CA 94025 USA) W Wenbing Yun (Sigray Inc. Concord CA 94250 USA) P Peter Cloetens P Piero Pianetta (Stanford Synchrotron Radiation Lightsource) K Kejie Zhao (School of Mechanical Engineering, Purdue University, West Lafayette, IN, USA.) O Ofodike A. Ezekoye Y Yijin Liu (Walker Department of Mechanical Engineering)

Abstract

AbstractLithium‐ion batteries are indispensable power sources for a wide range of modern electronic devices. However, battery lifespan remains a critical limitation, directly affecting the sustainability and user experience. Conventional battery failure analysis in controlled lab settings may not capture the complex interactions and environmental factors encountered in real‐world, in‐device operating conditions. This study analyzes the failure of commercial wireless earbud batteries as a model system within their intended usage context. Through multiscale and multimodal characterizations, the degradations from the material level to the device level are correlated, elucidating a failure pattern that is closely tied to the specific device configuration and operating conditions. The findings indicate that the ultimate failure mode is determined by the interplay of battery materials, cell structural design, and the in‐device microenvironment, such as temperature gradients and their fluctuations. This holistic, in‐device perspective on environmental influences provides critical insights for battery integration design, enhancing the reliability of modern electronics.

Article Details

Volume / Issue Vol. 37, Issue 10
Published March 01, 2025
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (21)

G

Guannan Qian

Walker Department of Mechanical Engineering

G

Guibin Zan

Stanford Synchrotron Radiation Lightsource SLAC National Accelerator Laboratory Menlo Park CA 94025 USA

J

Jizhou Li

D

Dechao Meng

T

Tianxiao Sun

Walker Department of Mechanical Engineering

V

Vivek Thampy

A

Ayrton M. Yanyachi

Walker Department of Mechanical Engineering The University of Texas at Austin Austin TX 78712 USA

X

Xiaojing Huang

H

Hanfei Yan

National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, United States

Y

Yong S. Chu

S

Sheraz Gul

Sigray Inc. Concord CA 94250 USA

J

Juanjuan Huang

S

Shelly D. Kelly

Advanced Photon Source Argonne National Laboratory Lemont IL 60439 USA

S

Sang‐Jun Lee

Stanford Synchrotron Radiation Lightsource SLAC National Accelerator Laboratory Menlo Park CA 94025 USA

J

Jun‐Sik Lee

Stanford Synchrotron Radiation Lightsource SLAC National Accelerator Laboratory Menlo Park CA 94025 USA

W

Wenbing Yun

Sigray Inc. Concord CA 94250 USA

P

Peter Cloetens

P

Piero Pianetta

Stanford Synchrotron Radiation Lightsource

K

Kejie Zhao

School of Mechanical Engineering, Purdue University, West Lafayette, IN, USA.

O

Ofodike A. Ezekoye

Y

Yijin Liu

Walker Department of Mechanical Engineering