Superior Adhesion of Monolayer Amorphous Carbon to Copper

H Hongji Zhang A Artem K. Grebenko (Department of Physics National University of Singapore Singapore Singapore) K Konstantin V. Iakoubovskii (Department of Physics National University of Singapore Singapore Singapore) H Hanning Zhang R Ruslan Yamaletdinov (Institute of Physics Ecole Polytechnique Fédérale de Lausanne (EPFL) Lausanne CH‐1015 Switzerland) A Anna Makarova (Helmholtz‐Zentrum Berlin für Materialien und Energie Berlin Germany) A Alexander Fedorov R Rejaul SK (Division of Physics and Applied Physics School of Physical and Mathematical Sciences Nanyang Technological University Singapore 637371 Singapore) R Ranjith Shivajirao Z Zheng Jue Tong S Sergey Grebenchuk U Ugur Karadeniz (Department of Materials Science and Engineering National University of Singapore Singapore 117575 Singapore) L Lu Shi (College of Pharmaceutical Sciences, Liangzhu Laboratory) D Denis V. Vyalikh (Donostia International Physics Center 1 , 20018 Donostia–San Sebastian,) Y Ya He A Andrei Starkov (Institute for Functional Intelligent Materials National University of Singapore Singapore Singapore) A Alena A. Alekseeva (Department of Physics National University of Singapore Singapore 117551 Singapore) C Chuan Chu Tee (Department of Materials Science and Engineering National University of Singapore Singapore 117575 Singapore) C Carlo Mendoza Orofeo (Department of Materials Science and Engineering National University of Singapore Singapore 117575 Singapore) J Junhao Lin K Kazutomo Suenaga (NCNST‐OU collaborative laboratory SANKEN The Institute of Scientific and Industrial Research) The University of Osaka Osaka Japan) M Michel Bosman M Maciej Koperski B Bent Weber K Kostya S. Novoselov O Oleg V. Yazyev C Chee‐Tat Toh (Department of Materials Science and Engineering National University of Singapore Singapore Singapore) B Barbaros Özyilmaz

Abstract

Abstract The single‐atom thickness of graphene holds great potential for device scaling, but its effectiveness as a thin metal‐ion diffusion barrier in microelectronics and a corrosion barrier for plasmonic devices is compromised by weak van der Waals interactions with copper (Cu), leading to delamination issues. In contrast, monolayer amorphous carbon (MAC), a recently reported single‐atom‐thick carbon film with a disordered sp 2 hybridized structure, demonstrates superior adhesion properties. This study reveals that MAC exhibits an adhesion energy of 85 J m −2 on Cu, which is 13 times greater than that of graphene. This exceptional adhesion is attributed to the formation of covalent‐like Cu─C bonds while preserving its sp 2 structure, as evidenced by X‐ray photoelectron spectroscopy (XPS) and near‐edge X‐ray absorption fine structure (NEXAFS) spectroscopy. Density functional theory (DFT) calculations further elucidate that the corrugated structure of MAC facilitates the hybridization of C 2p z orbitals with Cu 4s and 3dz 2 orbitals, promoting strong bonding. These insights indicate that the amorphous structure of MAC significantly enhances adhesion while preserving its elemental composition, providing a pathway to improve the mechanical reliability and performance of two‐dimensional (2D) materials on metal substrates in various technological applications.

Article Details

Volume / Issue Vol. 37, Issue 32
Published August 01, 2025
ISSN 0935-9648
Publisher Unknown Publisher

Journal Info

Advanced Materials

Unknown Publisher

ISSN: 0935-9648 Physical Sciences

Authors (28)

H

Hongji Zhang

A

Artem K. Grebenko

Department of Physics National University of Singapore Singapore Singapore

K

Konstantin V. Iakoubovskii

Department of Physics National University of Singapore Singapore Singapore

H

Hanning Zhang

R

Ruslan Yamaletdinov

Institute of Physics Ecole Polytechnique Fédérale de Lausanne (EPFL) Lausanne CH‐1015 Switzerland

A

Anna Makarova

Helmholtz‐Zentrum Berlin für Materialien und Energie Berlin Germany

A

Alexander Fedorov

R

Rejaul SK

Division of Physics and Applied Physics School of Physical and Mathematical Sciences Nanyang Technological University Singapore 637371 Singapore

R

Ranjith Shivajirao

Z

Zheng Jue Tong

S

Sergey Grebenchuk

U

Ugur Karadeniz

Department of Materials Science and Engineering National University of Singapore Singapore 117575 Singapore

L

Lu Shi

College of Pharmaceutical Sciences, Liangzhu Laboratory

D

Denis V. Vyalikh

Donostia International Physics Center 1 , 20018 Donostia–San Sebastian,

Y

Ya He

A

Andrei Starkov

Institute for Functional Intelligent Materials National University of Singapore Singapore Singapore

A

Alena A. Alekseeva

Department of Physics National University of Singapore Singapore 117551 Singapore

C

Chuan Chu Tee

Department of Materials Science and Engineering National University of Singapore Singapore 117575 Singapore

C

Carlo Mendoza Orofeo

Department of Materials Science and Engineering National University of Singapore Singapore 117575 Singapore

J

Junhao Lin

K

Kazutomo Suenaga

NCNST‐OU collaborative laboratory SANKEN The Institute of Scientific and Industrial Research) The University of Osaka Osaka Japan

M

Michel Bosman

M

Maciej Koperski

B

Bent Weber

K

Kostya S. Novoselov

O

Oleg V. Yazyev

C

Chee‐Tat Toh

Department of Materials Science and Engineering National University of Singapore Singapore Singapore

B

Barbaros Özyilmaz